BitAlyzer® Bit Error Rate (BER) Measurement Tester

Tektronix BitAlyzer does the analysis needed to find the source of Bit Errors. It is a Pattern Generator cum Error Analyzer system used for Bit Error Rate (BER) Analysis.

The BitAlyzer Bit Error Rate Testers are the industry’s best solution to the challenging signal integrity and BER issues faced by designers verifying, characterizing, debugging, and testing sophisticated electronic and satellite communication system designs. The BitAlyzer features exceptional performance in signal generation and analysis, operational simplicity, and unmatched debugging tools to accelerate your day-to-day tasks. The most comprehensive suite of physical-layer test tools available and the intuitive user interface provide easy access to the maximum amount of information.

Features of BitAlyzer® Bit Error Rate (BER) Tester

  • Pattern Generation and Error Analysis, highspeed BER Measurements up to 1.6 Gb/s. The combination of generation and analysis in one instrument enables receiver BER compliance testing for today’s electronic and communications systems.
  • Integrated Stress Generator for stressed eye sensitivity (SRS) and jitter tolerance compliance testing. A test signal’s data rate, applied stress, and data pattern can be changed on the fly, independent of each other; enabling a diverse set of signal variations for testing chipset/system sensitivity.
  • Integrated, BER correlated eye diagram analysis with pass/fail masks. Rapidly understand BER performance limitations, assess deterministic vs random errors, perform detailed pattern dependent error analysis, error burst analysis, and perform error free interval analysis.
  • Error Location and BER contour analysis on PRBS signals up to 26 GB/sec. Provides a quick understanding of signal integrity in terms of BER. Error location provides detailed BER pattern sensitivities to speed up identification of deterministic vs. random BER errors.
  • ANSI Jitter Measurements (RJ, DJ, and TJ). Fast, effective method for determining long pattern PRBS31 jitter composition with triangulation. Graphical representation makes jitter analysis more thorough, yet simpler to follow.
  • BER Contour with Automatic Mask Creation. Measure and view the eye diagram opening as a function of BER.